Donate to e Foundation | Murena handsets with /e/OS | Own a part of Murena! Learn more

Skip to content
Commit 21244fc1 authored by Janis Danisevskis's avatar Janis Danisevskis
Browse files

Dice HAL: Add VTS Test.

This CL adds a VTS test for the DICE HAL, and a test specific for
demotion testing. Demotion testing leaves the device in a permanently
modified state untill the next reboot, which is why it needs a special
test config. The current test config restarts the device before testing,
in a followup the device also has to reboot after the test.

Bug: 198197213
Test: atest VtsAidlDiceTargetTest
      atest VtsAidlDiceDemoteTargetTest
Change-Id: I4278a1352df749da50dc8e5d118fc37336026061
parent 86124738
Loading
Loading
Loading
Loading
0% Loading or .
You are about to add 0 people to the discussion. Proceed with caution.
Finish editing this message first!
Please register or to comment