Strictly deprecate IRPC test mode key generation

It's already documented that IRPC v3 doesn't make use of test mode keys
however VTS still required support for their generation. Fix this and
simplify implementation of the v3 HAL by expecting an error in all cases
that the deprecated test mode keys are seen.

IRPC v3 also fully deprecated the EEK meaning a v3 implementation must
unconditionally report CURVE_NONE for supportedEekCurve.

The VTS tests are enhanced with contextual version constants rather than
reusing constants with seemingly unrelated names.

Bug: 278013975
Test: atest VtsHalRemotelyProvisionedComponentTargetTest
(cherry picked from https://android-review.googlesource.com/q/commit:f2ae193680d6f02a2394423f805aadd13a7d152b)
Merged-In: I5709a0b1cd77eb28e677f64bb781fad58d91570a
Change-Id: I5709a0b1cd77eb28e677f64bb781fad58d91570a