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Commit ceff95d4 authored by Colin Cross's avatar Colin Cross Committed by Greg Kroah-Hartman
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ion: add test device for unit tests to interact with dma_bufs



Add a /dev/ion-test device that will be created if CONFIG_ION_TEST
is set.  The device accepts a dma_buf fd and allows reading and
writing to the backing memory using DMA-like apis or kernel mapping
apis.  Can be used to test the dma_buf mapping ops, including
the ion implementations, from userspace.

Signed-off-by: default avatarColin Cross <ccross@android.com>
Signed-off-by: default avatarJohn Stultz <john.stultz@linaro.org>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@linuxfoundation.org>
parent c13d1df9
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