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Commit 75d22b32 authored by Johan Hovold's avatar Johan Hovold Committed by Greg Kroah-Hartman
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USB: keyspan_pda: remove bogus disconnect test in close



Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: default avatarJohan Hovold <jhovold@gmail.com>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@linuxfoundation.org>
parent d7f08452
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+2 −7
Original line number Diff line number Diff line
@@ -649,14 +649,9 @@ static int keyspan_pda_open(struct tty_struct *tty,
}
static void keyspan_pda_close(struct usb_serial_port *port)
{
	struct usb_serial *serial = port->serial;

	if (serial->dev) {
		/* shutdown our bulk reads and writes */
	usb_kill_urb(port->write_urb);
	usb_kill_urb(port->interrupt_in_urb);
}
}


/* download the firmware to a "fake" device (pre-renumeration) */