Donate to e Foundation | Murena handsets with /e/OS | Own a part of Murena! Learn more

Commit 3cead61b authored by Pomai Ahlo's avatar Pomai Ahlo
Browse files

Convert BTMAllocateSCNTest to black box test 

Instead of directly modifying btm_cb variables, use existing scn
allocation logic.

Bug: 299158235
Test: atest net_test_stack_btm
Change-Id: I2079d5ecd0cecc5c6cc53b4e3198bbdf9d47447d
parent 392ed658

system/stack/test/btm/btm_scn_test.cc

+19 −23
Original line number Diff line number Diff line
@@ -41,50 +41,46 @@ class BtmAllocateSCNTest : public Test { 
};



TEST_F(BtmAllocateSCNTest, scn_available_after_available_index) {

  btm_cb.btm_available_index = 5;

  uint8_t occupied_idx[] = {1, 2, 3, 4, 5, 6, 7};

  for (uint8_t idx : occupied_idx) {

    btm_cb.btm_scn[idx] = true;

  }

  ASSERT_EQ(BTM_AllocateSCN(), 2);

  ASSERT_EQ(BTM_AllocateSCN(), 3);

  ASSERT_TRUE(BTM_TryAllocateSCN(4));

  ASSERT_TRUE(BTM_TryAllocateSCN(5));



  uint8_t scn = BTM_AllocateSCN();

  ASSERT_EQ(scn, 9);  // All indexes up to 7 are occupied; hence index 8 i.e.

                      // scn 9 should return

  // Available index should be 3, and the next available scn is 6

  ASSERT_EQ(BTM_AllocateSCN(), 6);

}



TEST_F(BtmAllocateSCNTest, scn_available_before_available_index) {

  btm_cb.btm_available_index = 28;

  uint8_t occupied_idx[] = {26, 27, 28, 29};

  for (uint8_t idx : occupied_idx) {

    btm_cb.btm_scn[idx] = true;

  for (uint8_t scn = 2; scn <= RFCOMM_MAX_SCN; scn++) {

    ASSERT_TRUE(BTM_TryAllocateSCN(scn));

  }

  ASSERT_TRUE(BTM_FreeSCN(28));

  ASSERT_EQ(BTM_AllocateSCN(), 28);

  ASSERT_TRUE(BTM_FreeSCN(2));



  uint8_t scn = BTM_AllocateSCN();

  ASSERT_EQ(scn, 2);  // All SCN from available to 30 are occupied; hence cycle

                      // to beginning.

  // Available index is 27, and the available scn is 2

  ASSERT_EQ(BTM_AllocateSCN(), 2);

}



TEST_F(BtmAllocateSCNTest, can_allocate_all_scns) {

  for (uint8_t scn = 2; scn <= RFCOMM_MAX_SCN; scn++) {

    EXPECT_EQ(BTM_AllocateSCN(), scn);

    ASSERT_EQ(BTM_AllocateSCN(), scn);

  }

}



TEST_F(BtmAllocateSCNTest, only_last_scn_available) {

  // Fill all relevant SCN except the last

  for (uint8_t scn = 2; scn < RFCOMM_MAX_SCN; scn++) {

    btm_cb.btm_scn[scn - 1] = true;

    ASSERT_EQ(BTM_AllocateSCN(), scn);

  }



  EXPECT_EQ(BTM_AllocateSCN(), RFCOMM_MAX_SCN);

  ASSERT_EQ(BTM_AllocateSCN(), RFCOMM_MAX_SCN);

}



TEST_F(BtmAllocateSCNTest, no_scn_available) {

  for (int i = 1; i < RFCOMM_MAX_SCN;

       i++) {  // Fill all relevant SCN indexes (1 to 29)

    btm_cb.btm_scn[i] = true;

  for (uint8_t scn = 2; scn <= RFCOMM_MAX_SCN; scn++) {

    ASSERT_EQ(BTM_AllocateSCN(), scn);

  }



  uint8_t scn = BTM_AllocateSCN();

  EXPECT_EQ(scn, 0) << "scn = " << scn << "and not 0";

  ASSERT_EQ(BTM_AllocateSCN(), 0);

}