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Commit c0299961 authored by Keun Soo Yim's avatar Keun Soo Yim Committed by Ruchi Kandoi
Browse files

increase the timeouts to 10mins for nfc target-side tests 

Test: local direct binary runs (1.5mins on average)
Change-Id: Id85633a6a4a55a9d6876142447521146cd6e57f3
parent 437e0f14

nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml

+1 −1
Original line number Diff line number Diff line
@@ -26,6 +26,6 @@ 
            "/>

        <option name="test-config-path" value="vts/testcases/hal/nfc/hidl/target/HalNfcHidlTargetBasicTest.config" />

        <option name="binary-test-type" value="gtest" />

        <option name="test-timeout" value="1m" />

        <option name="test-timeout" value="10m" />

    </test>

</configuration>

nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml

+1 −1
Original line number Diff line number Diff line
@@ -25,7 +25,7 @@ 
            _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test,

            "/>

        <option name="binary-test-type" value="gtest" />

        <option name="test-timeout" value="1m" />

        <option name="test-timeout" value="10m" />

    <option name="enable-profiling" value="true" />

    </test>

</configuration>