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Commit bb9550c3 authored by Keun Soo Yim's avatar Keun Soo Yim Committed by android-build-merger
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increase the timeouts to 10mins for nfc target-side tests am: 4fbf7848 am: 6525f455 

am: 80bc2871

Change-Id: Ie26d8d3135295bb3f3562dca66c51fcd8d3739e7
parents 626bca20 80bc2871

nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml

+1 −1
Original line number Diff line number Diff line
@@ -26,6 +26,6 @@ 
            "/>

        <option name="test-config-path" value="vts/testcases/hal/nfc/hidl/target/HalNfcHidlTargetBasicTest.config" />

        <option name="binary-test-type" value="gtest" />

        <option name="test-timeout" value="1m" />

        <option name="test-timeout" value="10m" />

    </test>

</configuration>

nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml

+1 −1
Original line number Diff line number Diff line
@@ -25,7 +25,7 @@ 
            _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test,

            "/>

        <option name="binary-test-type" value="gtest" />

        <option name="test-timeout" value="1m" />

        <option name="test-timeout" value="10m" />

    <option name="enable-profiling" value="true" />

    </test>

</configuration>