Merge "Fix consumerir test bugs" into oc-dev (9f0b8369) · Commits · e / os / android_hardware_interfaces

ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp

+1 −2

Original line number	Diff line number	Diff line
		@@ -59,7 +59,7 @@ TEST_F(ConsumerIrHidlTest, TransmitTest) {
		uint32_t len = 16;
		hidl_vec<int32_t> vec;
		vec.resize(len);
		std::fill(vec.begin(), vec.end(), 1);
		std::fill(vec.begin(), vec.end(), 1000);
		for (auto range = ranges.begin(); range != ranges.end(); range++) {
		EXPECT_TRUE(ir->transmit(range->min, vec));
		EXPECT_TRUE(ir->transmit(range->max, vec));
		@@ -74,7 +74,6 @@ TEST_F(ConsumerIrHidlTest, BadFreqTest) {
		vec.resize(len);
		std::fill(vec.begin(), vec.end(), 1);
		EXPECT_FALSE(ir->transmit(-1, vec));
		EXPECT_FALSE(ir->transmit(0, vec));
		}

		int main(int argc, char **argv) {