Loading ir/1.0/vts/functional/Android.bp +1 −1 Original line number Diff line number Diff line Loading @@ -21,5 +21,5 @@ cc_test { static_libs: [ "android.hardware.ir@1.0", ], test_suites: ["general-tests"], test_suites: ["general-tests", "vts-core"], } ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp +11 −30 Original line number Diff line number Diff line Loading @@ -21,8 +21,9 @@ #include <android/hardware/ir/1.0/IConsumerIr.h> #include <android/hardware/ir/1.0/types.h> #include <VtsHalHidlTargetTestBase.h> #include <VtsHalHidlTargetTestEnvBase.h> #include <gtest/gtest.h> #include <hidl/GtestPrinter.h> #include <hidl/ServiceManagement.h> #include <algorithm> using ::android::hardware::ir::V1_0::IConsumerIr; Loading @@ -31,26 +32,10 @@ using ::android::hardware::hidl_vec; using ::android::hardware::Return; using ::android::sp; // Test environment for Ir class ConsumerIrHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase { public: // get the test environment singleton static ConsumerIrHidlEnvironment* Instance() { static ConsumerIrHidlEnvironment* instance = new ConsumerIrHidlEnvironment; return instance; } virtual void registerTestServices() override { registerTestService<IConsumerIr>(); } private: ConsumerIrHidlEnvironment() {} }; // The main test class for IR HIDL HAL. class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase { class ConsumerIrHidlTest : public ::testing::TestWithParam<std::string> { public: virtual void SetUp() override { ir = ::testing::VtsHalHidlTargetTestBase::getService<IConsumerIr>( ConsumerIrHidlEnvironment::Instance()->getServiceName<IConsumerIr>()); ir = IConsumerIr::getService(GetParam()); ASSERT_NE(ir, nullptr); } Loading @@ -60,7 +45,7 @@ class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase { }; // Test transmit() for the min and max frequency of every available range TEST_F(ConsumerIrHidlTest, TransmitTest) { TEST_P(ConsumerIrHidlTest, TransmitTest) { bool success; hidl_vec<ConsumerIrFreqRange> ranges; auto cb = [&](bool s, hidl_vec<ConsumerIrFreqRange> v) { Loading @@ -84,7 +69,7 @@ TEST_F(ConsumerIrHidlTest, TransmitTest) { } // Test transmit() when called with invalid frequencies TEST_F(ConsumerIrHidlTest, BadFreqTest) { TEST_P(ConsumerIrHidlTest, BadFreqTest) { uint32_t len = 16; hidl_vec<int32_t> vec; vec.resize(len); Loading @@ -92,11 +77,7 @@ TEST_F(ConsumerIrHidlTest, BadFreqTest) { EXPECT_FALSE(ir->transmit(-1, vec)); } int main(int argc, char **argv) { ::testing::AddGlobalTestEnvironment(ConsumerIrHidlEnvironment::Instance()); ::testing::InitGoogleTest(&argc, argv); ConsumerIrHidlEnvironment::Instance()->init(&argc, argv); int status = RUN_ALL_TESTS(); LOG(INFO) << "Test result = " << status; return status; } INSTANTIATE_TEST_SUITE_P( PerInstance, ConsumerIrHidlTest, testing::ValuesIn(android::hardware::getAllHalInstanceNames(IConsumerIr::descriptor)), android::hardware::PrintInstanceNameToString); Loading
ir/1.0/vts/functional/Android.bp +1 −1 Original line number Diff line number Diff line Loading @@ -21,5 +21,5 @@ cc_test { static_libs: [ "android.hardware.ir@1.0", ], test_suites: ["general-tests"], test_suites: ["general-tests", "vts-core"], }
ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp +11 −30 Original line number Diff line number Diff line Loading @@ -21,8 +21,9 @@ #include <android/hardware/ir/1.0/IConsumerIr.h> #include <android/hardware/ir/1.0/types.h> #include <VtsHalHidlTargetTestBase.h> #include <VtsHalHidlTargetTestEnvBase.h> #include <gtest/gtest.h> #include <hidl/GtestPrinter.h> #include <hidl/ServiceManagement.h> #include <algorithm> using ::android::hardware::ir::V1_0::IConsumerIr; Loading @@ -31,26 +32,10 @@ using ::android::hardware::hidl_vec; using ::android::hardware::Return; using ::android::sp; // Test environment for Ir class ConsumerIrHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase { public: // get the test environment singleton static ConsumerIrHidlEnvironment* Instance() { static ConsumerIrHidlEnvironment* instance = new ConsumerIrHidlEnvironment; return instance; } virtual void registerTestServices() override { registerTestService<IConsumerIr>(); } private: ConsumerIrHidlEnvironment() {} }; // The main test class for IR HIDL HAL. class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase { class ConsumerIrHidlTest : public ::testing::TestWithParam<std::string> { public: virtual void SetUp() override { ir = ::testing::VtsHalHidlTargetTestBase::getService<IConsumerIr>( ConsumerIrHidlEnvironment::Instance()->getServiceName<IConsumerIr>()); ir = IConsumerIr::getService(GetParam()); ASSERT_NE(ir, nullptr); } Loading @@ -60,7 +45,7 @@ class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase { }; // Test transmit() for the min and max frequency of every available range TEST_F(ConsumerIrHidlTest, TransmitTest) { TEST_P(ConsumerIrHidlTest, TransmitTest) { bool success; hidl_vec<ConsumerIrFreqRange> ranges; auto cb = [&](bool s, hidl_vec<ConsumerIrFreqRange> v) { Loading @@ -84,7 +69,7 @@ TEST_F(ConsumerIrHidlTest, TransmitTest) { } // Test transmit() when called with invalid frequencies TEST_F(ConsumerIrHidlTest, BadFreqTest) { TEST_P(ConsumerIrHidlTest, BadFreqTest) { uint32_t len = 16; hidl_vec<int32_t> vec; vec.resize(len); Loading @@ -92,11 +77,7 @@ TEST_F(ConsumerIrHidlTest, BadFreqTest) { EXPECT_FALSE(ir->transmit(-1, vec)); } int main(int argc, char **argv) { ::testing::AddGlobalTestEnvironment(ConsumerIrHidlEnvironment::Instance()); ::testing::InitGoogleTest(&argc, argv); ConsumerIrHidlEnvironment::Instance()->init(&argc, argv); int status = RUN_ALL_TESTS(); LOG(INFO) << "Test result = " << status; return status; } INSTANTIATE_TEST_SUITE_P( PerInstance, ConsumerIrHidlTest, testing::ValuesIn(android::hardware::getAllHalInstanceNames(IConsumerIr::descriptor)), android::hardware::PrintInstanceNameToString);