Merge "power: qpnp-fg: validate temperature reading" (f15eb7c5) · Commits · e / devices / android_kernel_xiaomi_markw

Documentation/devicetree/bindings/power/qpnp-fg.txt

+16 −0

Original line number	Diff line number	Diff line
		@@ -255,6 +255,22 @@ Parent node optional properties:
		empty battery condition. If this is
		not specified, empty battery condition
		is detected by empty-soc interrupt.
		- qcom,fg-batt-temp-low-limit: Battery temperature (in decidegC) low
		limit which will be used to validate
		the battery temperature reading from FG.
		If the battery temperature goes below
		this limit, last read good temperature
		will be notified to userspace. If this
		limit is not specified, then the
		default limit would be -60C.
		- qcom,fg-batt-temp-high-limit: Battery temperature (in decidegC) high
		limit which will be used to validate
		the battery temperature reading from FG.
		If the battery temperature goes above
		this limit, last read good temperature
		will be notified to userspace. If this
		limit is not specified, then the
		default limit would be 150C.

		qcom,fg-soc node required properties:
		- reg : offset and length of the PMIC peripheral register map.

drivers/power/qpnp-fg.c

+44 −2

Original line number	Diff line number	Diff line
		@@ -592,6 +592,9 @@ struct fg_chip {
		bool irqs_enabled;
		bool use_last_soc;
		int last_soc;
		int last_good_temp;
		int batt_temp_low_limit;
		int batt_temp_high_limit;
		};

		/* FG_MEMIF DEBUGFS structures */
		@@ -2565,6 +2568,8 @@ out:
		TEMP_SENSE_CHARGE_BIT)
		#define TEMP_PERIOD_UPDATE_MS 10000
		#define TEMP_PERIOD_TIMEOUT_MS 3000
		#define BATT_TEMP_LOW_LIMIT -600
		#define BATT_TEMP_HIGH_LIMIT 1500
		static void update_temp_data(struct work_struct *work)
		{
		s16 temp;
		@@ -2616,8 +2621,33 @@ wait:
		}

		temp = reg[0] \| (reg[1] << 8);
		fg_data[0].value = (temp * TEMP_LSB_16B / 1000)
		- DECIKELVIN;
		temp = (temp * TEMP_LSB_16B / 1000) - DECIKELVIN;

		/*
		* If temperature is within the specified range (e.g. -60C and 150C),
		* update it to the userspace. Otherwise, use the last read good
		* temperature.
		*/
		if (temp > chip->batt_temp_low_limit &&
		temp < chip->batt_temp_high_limit) {
		chip->last_good_temp = temp;
		fg_data[0].value = temp;
		} else {
		fg_data[0].value = chip->last_good_temp;

		/*
		* If the temperature is read before and seems to be in valid
		* range, then a bad temperature reading could be because of
		* FG lockup. Trigger the FG reset sequence in such cases.
		*/
		if (chip->last_temp_update_time && fg_reset_on_lockup &&
		(chip->last_good_temp > chip->batt_temp_low_limit &&
		chip->last_good_temp < chip->batt_temp_high_limit)) {
		pr_err("Batt_temp is %d !, triggering FG reset\n",
		temp);
		fg_check_ima_error_handling(chip);
		}
		}

		if (fg_debug_mask & FG_MEM_DEBUG_READS)
		pr_info("BATT_TEMP %d %d\n", temp, fg_data[0].value);
		@@ -6405,6 +6435,16 @@ static int fg_of_init(struct fg_chip *chip)
		chip->use_vbat_low_empty_soc = of_property_read_bool(node,
		"qcom,fg-use-vbat-low-empty-soc");

		OF_READ_PROPERTY(chip->batt_temp_low_limit,
		"fg-batt-temp-low-limit", rc, BATT_TEMP_LOW_LIMIT);

		OF_READ_PROPERTY(chip->batt_temp_high_limit,
		"fg-batt-temp-high-limit", rc, BATT_TEMP_HIGH_LIMIT);

		if (fg_debug_mask & FG_STATUS)
		pr_info("batt-temp-low_limit: %d batt-temp-high_limit: %d\n",
		chip->batt_temp_low_limit, chip->batt_temp_high_limit);

		return rc;
		}

		@@ -7987,6 +8027,8 @@ static int fg_probe(struct spmi_device *spmi)
		}
		}

		/* Fake temperature till the actual temperature is read */
		chip->last_good_temp = 250;
		schedule_work(&chip->init_work);

		pr_info("FG Probe success - FG Revision DIG:%d.%d ANA:%d.%d PMIC subtype=%d\n",