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Commit 428f432b authored by Gilad Broner's avatar Gilad Broner Committed by Matt Wagantall
Browse files

block: test-iosched: enable running of simultaneous tests 



Current test-iosched design enables running only a single test
for a single block device.
This change modifies the test-iosched framework to allow running
several tests on several block devices.

Change-Id: I051d842733873488b64e89053d9c4e30e1249870
Signed-off-by: default avatarGilad Broner <gbroner@codeaurora.org>
[merez@codeaurora.org: fix conflicts due to removal of BKOPs UT]
Signed-off-by: default avatarMaya Erez <merez@codeaurora.org>
Signed-off-by: default avatarVenkat Gopalakrishnan <venkatg@codeaurora.org>
parent 2d7c4eac

block/test-iosched.c

+317 −287

File changed.

Preview size limit exceeded, changes collapsed.

drivers/mmc/card/mmc_block_test.c

+354 −255

File changed.

Preview size limit exceeded, changes collapsed.

drivers/scsi/ufs/ufs_test.c

+215 −163

File changed.

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include/linux/test-iosched.h

+41 −43
Original line number Diff line number Diff line 
/* Copyright (c) 2012-2014, The Linux Foundation. All rights reserved.

/* Copyright (c) 2012-2015, The Linux Foundation. All rights reserved.

 *

 * This program is free software; you can redistribute it and/or modify

 * it under the terms of the GNU General Public License version 2 and
@@ -30,17 +30,17 @@ 
#define BIO_U32_SIZE 1024

#define TEST_BIO_SIZE		PAGE_SIZE	/* use one page bios */



struct test_data;

struct test_iosched;



typedef int (prepare_test_fn) (struct test_data *);

typedef int (run_test_fn) (struct test_data *);

typedef int (check_test_result_fn) (struct test_data *);

typedef int (post_test_fn) (struct test_data *);

typedef char* (get_test_case_str_fn) (struct test_data *);

typedef void (blk_dev_test_init_fn) (void);

typedef void (blk_dev_test_exit_fn) (void);

typedef struct gendisk* (get_rq_disk_fn) (void);

typedef bool (check_test_completion_fn) (void);

typedef int (prepare_test_fn) (struct test_iosched *);

typedef int (run_test_fn) (struct test_iosched *);

typedef int (check_test_result_fn) (struct test_iosched *);

typedef int (post_test_fn) (struct test_iosched *);

typedef char* (get_test_case_str_fn) (int);

typedef int (blk_dev_test_init_fn) (struct test_iosched *);

typedef void (blk_dev_test_exit_fn) (struct test_iosched *);

typedef struct gendisk* (get_rq_disk_fn) (struct test_iosched *);

typedef bool (check_test_completion_fn) (struct test_iosched *);



/**

 * enum test_state - defines the state of the test
@@ -155,11 +155,13 @@ struct test_info { 
/**

 * struct blk_dev_test_type - identifies block device test

 * @list:		list head pointer

 * @type_prefix:	prefix of device class name, i.e. "mmc"/ "sd"

 * @init_fn:		block device test init callback

 * @exit_fn:		block device test exit callback

 */

struct blk_dev_test_type {

	struct list_head list;

	const char *type_prefix;

	blk_dev_test_init_fn *init_fn;

	blk_dev_test_exit_fn *exit_fn;

};
@@ -205,8 +207,9 @@ struct blk_dev_test_type { 
 *			test round was disturbed by an external

 *			flush request, therefore disqualifying

 *			the results

 * @blk_dev_test_data:	associated specific block device test utility

 */

struct test_data {

struct test_iosched {

	struct list_head queue;

	struct list_head test_queue;

	struct list_head dispatched_queue;
@@ -230,42 +233,37 @@ struct test_data { 
	bool fs_wr_reqs_during_test;

	bool ignore_round;

	bool notified_urgent;

	void *blk_dev_test_data;

};



extern int test_iosched_start_test(struct test_info *t_info);

extern void test_iosched_mark_test_completion(void);

extern void check_test_completion(void);

extern int test_iosched_add_unique_test_req(int is_err_expcted,

		enum req_unique_type req_unique,

extern int test_iosched_start_test(struct test_iosched *,

	struct test_info *t_info);

extern void test_iosched_mark_test_completion(struct test_iosched *);

extern void check_test_completion(struct test_iosched *);

extern int test_iosched_add_unique_test_req(struct test_iosched *,

	int is_err_expcted, enum req_unique_type req_unique,

	int start_sec, int nr_sects, rq_end_io_fn *end_req_io);

extern int test_iosched_add_wr_rd_test_req(int is_err_expcted,

	      int direction, int start_sec,

	      int num_bios, int pattern, rq_end_io_fn *end_req_io);

extern struct test_request *test_iosched_create_test_req(int is_err_expcted,

	      int direction, int start_sec,

	      int num_bios, int pattern, rq_end_io_fn *end_req_io);

extern int test_iosched_add_wr_rd_test_req(struct test_iosched *,

	int is_err_expcted, int direction, int start_sec, int num_bios,

	int pattern, rq_end_io_fn *end_req_io);

extern struct test_request *test_iosched_create_test_req(struct test_iosched *,

	int is_err_expcted, int direction, int start_sec, int num_bios,

	int pattern, rq_end_io_fn *end_req_io);



extern struct dentry *test_iosched_get_debugfs_tests_root(void);

extern struct dentry *test_iosched_get_debugfs_utils_root(void);

extern void test_iosched_set_test_result(struct test_iosched*, int test_result);



extern struct request_queue *test_iosched_get_req_queue(void);

extern void test_iosched_set_ignore_round(struct test_iosched *,

	bool ignore_round);



extern void test_iosched_set_test_result(int);

extern void test_iosched_register(struct blk_dev_test_type *bdt);



void test_iosched_set_ignore_round(bool ignore_round);

extern void test_iosched_unregister(struct blk_dev_test_type *bdt);



void test_iosched_register(struct blk_dev_test_type *bdt);

extern void test_iosched_add_urgent_req(struct test_iosched *,

	struct test_request *);



void test_iosched_unregister(struct blk_dev_test_type *bdt);

extern void check_test_completion(struct test_iosched *);



extern struct test_data *test_get_test_data(void);



void test_iosched_add_urgent_req(struct test_request *test_rq);



int test_is_req_urgent(struct request *rq);



void check_test_completion(void);



int compare_buffer_to_pattern(struct test_request *test_rq);

extern int compare_buffer_to_pattern(struct test_request *test_rq);



#endif /* _LINUX_TEST_IOSCHED_H */