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Commit 86f5362e authored by Lukasz Majewski's avatar Lukasz Majewski Committed by Eduardo Valentin
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thermal: exynos: Provide initial setting for TMU's test MUX address at Exynos4412 



The commit d0a0ce3e ("thermal: exynos: Add
missing definations and code cleanup") has removed setting of test MUX address
value at TMU configuration setting.

This field is not present on Exynos4210 and Exynos5 SoCs. However on Exynos4412
SoC it is required to set this field after reset because without it TMU shows
maximal available temperature, which causes immediate platform shutdown.

Signed-off-by: default avatarLukasz Majewski <l.majewski@samsung.com>
Reviewed-by: default avatarBartlomiej Zolnierkiewicz <b.zolnierkie@samsung.com>
Reviewed-by: default avatarTomasz Figa <t.figa@samsung.com>
Signed-off-by: default avatarEduardo Valentin <eduardo.valentin@ti.com>
parent 14ddfaec

drivers/thermal/samsung/exynos_tmu.c

+3 −0
Original line number Diff line number Diff line
@@ -317,6 +317,9 @@ static void exynos_tmu_control(struct platform_device *pdev, bool on) 


	con = readl(data->base + reg->tmu_ctrl);



	if (pdata->test_mux)

		con |= (pdata->test_mux << reg->test_mux_addr_shift);



	if (pdata->reference_voltage) {

		con &= ~(reg->buf_vref_sel_mask << reg->buf_vref_sel_shift);

		con |= pdata->reference_voltage << reg->buf_vref_sel_shift;

drivers/thermal/samsung/exynos_tmu.h

+4 −0
Original line number Diff line number Diff line
@@ -85,6 +85,7 @@ enum soc_type { 
 * @triminfo_reload_shift: shift of triminfo reload enable bit in triminfo_ctrl

	reg.

 * @tmu_ctrl: TMU main controller register.

 * @test_mux_addr_shift: shift bits of test mux address.

 * @buf_vref_sel_shift: shift bits of reference voltage in tmu_ctrl register.

 * @buf_vref_sel_mask: mask bits of reference voltage in tmu_ctrl register.

 * @therm_trip_mode_shift: shift bits of tripping mode in tmu_ctrl register.
@@ -151,6 +152,7 @@ struct exynos_tmu_registers { 
	u32	triminfo_reload_shift;



	u32	tmu_ctrl;

	u32     test_mux_addr_shift;

	u32	buf_vref_sel_shift;

	u32	buf_vref_sel_mask;

	u32	therm_trip_mode_shift;
@@ -258,6 +260,7 @@ struct exynos_tmu_registers { 
 * @first_point_trim: temp value of the first point trimming

 * @second_point_trim: temp value of the second point trimming

 * @default_temp_offset: default temperature offset in case of no trimming

 * @test_mux; information if SoC supports test MUX

 * @cal_type: calibration type for temperature

 * @cal_mode: calibration mode for temperature

 * @freq_clip_table: Table representing frequency reduction percentage.
@@ -287,6 +290,7 @@ struct exynos_tmu_platform_data { 
	u8 first_point_trim;

	u8 second_point_trim;

	u8 default_temp_offset;

	u8 test_mux;



	enum calibration_type cal_type;

	enum calibration_mode cal_mode;

drivers/thermal/samsung/exynos_tmu_data.c

+2 −0
Original line number Diff line number Diff line
@@ -98,6 +98,7 @@ static const struct exynos_tmu_registers exynos4412_tmu_registers = { 
	.triminfo_ctrl = EXYNOS_TMU_TRIMINFO_CON,

	.triminfo_reload_shift = EXYNOS_TRIMINFO_RELOAD_SHIFT,

	.tmu_ctrl = EXYNOS_TMU_REG_CONTROL,

	.test_mux_addr_shift = EXYNOS4412_MUX_ADDR_SHIFT,

	.buf_vref_sel_shift = EXYNOS_TMU_REF_VOLTAGE_SHIFT,

	.buf_vref_sel_mask = EXYNOS_TMU_REF_VOLTAGE_MASK,

	.therm_trip_mode_shift = EXYNOS_TMU_TRIP_MODE_SHIFT,
@@ -174,6 +175,7 @@ struct exynos_tmu_init_data const exynos4412_default_tmu_data = { 
		{

			EXYNOS4412_TMU_DATA,

			.type = SOC_ARCH_EXYNOS4412,

			.test_mux = EXYNOS4412_MUX_ADDR_VALUE,

		},

	},

	.tmu_count = 1,

drivers/thermal/samsung/exynos_tmu_data.h

+4 −0
Original line number Diff line number Diff line
@@ -95,6 +95,10 @@ 


#define EXYNOS_MAX_TRIGGER_PER_REG	4



/* Exynos4412 specific */

#define EXYNOS4412_MUX_ADDR_VALUE          6

#define EXYNOS4412_MUX_ADDR_SHIFT          20



/*exynos5440 specific registers*/

#define EXYNOS5440_TMU_S0_7_TRIM		0x000

#define EXYNOS5440_TMU_S0_7_CTRL		0x020