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Commit 93ed8359 authored by Carolyn Wyborny's avatar Carolyn Wyborny Committed by Jeff Kirsher
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igb: Fix reg pattern test in ethtool for i350 devices 



This fixes the reg_pattern_test so that the test does not fail
on i350 parts.

Signed-off-by: default avatarCarolyn Wyborny <carolyn.wyborny@intel.com>
Tested-by: default avatarJeff Pieper <jeffrey.e.pieper@intel.com>
Signed-off-by: default avatarJeff Kirsher <jeffrey.t.kirsher@intel.com>
parent 9b082d73

drivers/net/igb/igb_ethtool.c

+1 −1
Original line number Diff line number Diff line
@@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data, 
		{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};

	for (pat = 0; pat < ARRAY_SIZE(_test); pat++) {

		wr32(reg, (_test[pat] & write));

		val = rd32(reg);

		val = rd32(reg) & mask;

		if (val != (_test[pat] & write & mask)) {

			dev_err(&adapter->pdev->dev, "pattern test reg %04X "

				"failed: got 0x%08X expected 0x%08X\n",