Merge "Revert "disp: msm: dsi: Panic on getting continuous ESD check failures"" (eb3d20eb) · Commits · e / devices / android_kernel_fairphone_FP5

msm/dsi/dsi_display.h

+0 −3

Original line number	Diff line number	Diff line
		@@ -184,7 +184,6 @@ struct dsi_display_ext_bridge {
		* @misr_frame_count Number of frames to accumulate the MISR value
		* @esd_trigger field indicating ESD trigger through debugfs
		* @poms_te_work POMS delayed work for disabling panel TE
		* @esd_fail_count Count of continuous ESD check failures
		* @te_source vsync source pin information
		* @clk_gating_config Clocks for which clock gating needs to be enabled
		* @queue_cmd_waits Indicates if wait for dma commands done has to be queued.
		@@ -278,8 +277,6 @@ struct dsi_display {

		struct dsi_display_boot_param *boot_disp;

		u32 esd_fail_count;

		u32 te_source;
		u32 clk_gating_config;
		bool queue_cmd_waits;

msm/sde/sde_connector.c

+1 −29

Original line number	Diff line number	Diff line
		@@ -2380,8 +2380,6 @@ static void _sde_connector_report_panel_dead(struct sde_connector *conn,
		bool skip_pre_kickoff)
		{
		struct drm_event event;
		struct dsi_display *display;
		u32 const max_conseq_esd_fail_count = 5;

		if (!conn)
		return;
		@@ -2405,17 +2403,6 @@ static void _sde_connector_report_panel_dead(struct sde_connector *conn,
		conn->base.dev, &event, (u8 *)&conn->panel_dead);
		SDE_ERROR("esd check failed report PANEL_DEAD conn_id: %d enc_id: %d\n",
		conn->base.base.id, conn->encoder->base.id);

		if (conn->connector_type != DRM_MODE_CONNECTOR_DSI)
		return;

		display = (struct dsi_display *)conn->display;
		display->esd_fail_count++;
		if (display->esd_fail_count == max_conseq_esd_fail_count) {
		SDE_ERROR("Triggered reset on multiple PANEL_DEAD instances\n");
		SDE_DBG_DUMP("all", "dbg_bus", "dsi_dbg_bus",
		"vbif_dbg_bus", "panic");
		}
		}

		int sde_connector_esd_status(struct drm_connector *conn)
		@@ -2453,16 +2440,8 @@ int sde_connector_esd_status(struct drm_connector *conn)
		SDE_DEBUG("Successfully received TE from panel\n");
		ret = 0;
		}

		if (sde_conn->connector_type == DRM_MODE_CONNECTOR_DSI) {
		/* Reset esd_fail_count on recovery */
		if (!ret)
		display->esd_fail_count = 0;
		SDE_EVT32(ret, display->esd_fail_count);
		return ret;
		}

		SDE_EVT32(ret);

		return ret;
		}

		@@ -2471,7 +2450,6 @@ static void sde_connector_check_status_work(struct work_struct *work)
		struct sde_connector *conn;
		int rc = 0;
		struct device *dev;
		struct dsi_display *display;

		conn = container_of(to_delayed_work(work),
		struct sde_connector, status_work);
		@@ -2504,12 +2482,6 @@ static void sde_connector_check_status_work(struct work_struct *work)
		conn->esd_status_interval : STATUS_CHECK_INTERVAL_MS;
		schedule_delayed_work(&conn->status_work,
		msecs_to_jiffies(interval));

		/* Successful ESD check */
		if (conn->connector_type == DRM_MODE_CONNECTOR_DSI) {
		display = conn->display;
		display->esd_fail_count = 0;
		}
		return;
		}