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Commit 6a5f2a1f authored by Alexandre Belloni's avatar Alexandre Belloni
Browse files

rtc: ds1307: use rtc_add_group 



Register frequency test using rtc_add_group to avoid a possible race
condition and simplify the code.

This also moves the attribute to its proper location under the rtc device
instead of the i2c parent device.

Signed-off-by: default avatarAlexandre Belloni <alexandre.belloni@bootlin.com>
parent cfb74916

drivers/rtc/rtc-ds1307.c

+14 −39
Original line number Diff line number Diff line
@@ -1050,11 +1050,11 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset) 
				  ctrl_reg);

}



static ssize_t frequency_test_enable_store(struct device *dev,

static ssize_t frequency_test_store(struct device *dev,

				    struct device_attribute *attr,

				    const char *buf, size_t count)

{

	struct ds1307 *ds1307 = dev_get_drvdata(dev);

	struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);

	bool freq_test_en;

	int ret;
@@ -1070,11 +1070,11 @@ static ssize_t frequency_test_enable_store(struct device *dev, 
	return count;

}



static ssize_t frequency_test_enable_show(struct device *dev,

static ssize_t frequency_test_show(struct device *dev,

				   struct device_attribute *attr,

				   char *buf)

{

	struct ds1307 *ds1307 = dev_get_drvdata(dev);

	struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);

	unsigned int ctrl_reg;



	regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
@@ -1083,10 +1083,10 @@ static ssize_t frequency_test_enable_show(struct device *dev, 
			"off\n");

}



static DEVICE_ATTR_RW(frequency_test_enable);

static DEVICE_ATTR_RW(frequency_test);



static struct attribute *rtc_freq_test_attrs[] = {

	&dev_attr_frequency_test_enable.attr,

	&dev_attr_frequency_test.attr,

	NULL,

};
@@ -1094,13 +1094,6 @@ static const struct attribute_group rtc_freq_test_attr_group = { 
	.attrs		= rtc_freq_test_attrs,

};



static void rtc_calib_remove_sysfs_group(void *_dev)

{

	struct device *dev = _dev;



	sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);

}



static int ds1307_add_frequency_test(struct ds1307 *ds1307)

{

	int err;
@@ -1109,27 +1102,9 @@ static int ds1307_add_frequency_test(struct ds1307 *ds1307) 
	case m41t0:

	case m41t00:

	case m41t11:

		/* Export sysfs entries */

		err = sysfs_create_group(&(ds1307->dev)->kobj,

					 &rtc_freq_test_attr_group);

		if (err) {

			dev_err(ds1307->dev,

				"Failed to create sysfs group: %d\n",

				err);

			return err;

		}



		err = devm_add_action_or_reset(ds1307->dev,

					       rtc_calib_remove_sysfs_group,

					       ds1307->dev);

		if (err) {

			dev_err(ds1307->dev,

				"Failed to add sysfs cleanup action: %d\n",

				err);

			sysfs_remove_group(&(ds1307->dev)->kobj,

					   &rtc_freq_test_attr_group);

		err = rtc_add_group(ds1307->rtc, &rtc_freq_test_attr_group);

		if (err)

			return err;

		}

		break;

	default:

		break;
@@ -1876,11 +1851,11 @@ static int ds1307_probe(struct i2c_client *client, 
	}



	ds1307->rtc->ops = chip->rtc_ops ?: &ds13xx_rtc_ops;

	err = rtc_register_device(ds1307->rtc);

	err = ds1307_add_frequency_test(ds1307);

	if (err)

		return err;



	err = ds1307_add_frequency_test(ds1307);

	err = rtc_register_device(ds1307->rtc);

	if (err)

		return err;