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Commit 0baf29d6 authored by Jonathan Cameron's avatar Jonathan Cameron Committed by Greg Kroah-Hartman
Browse files

staging:iio:documentation Add abi docs for capacitance adcs. 



Signed-off-by: default avatarJonathan Cameron <jic23@cam.ac.uk>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@suse.de>
parent 15739cd2

drivers/staging/iio/Documentation/sysfs-bus-iio

+19 −0
Original line number Diff line number Diff line
@@ -92,6 +92,24 @@ Description: 
		is required is a consistent labeling.  Units after application

		of scale and offset are microvolts.



What:		/sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw

KernelVersion:	3.2

Contact:	linux-iio@vger.kernel.org

Description:

		Raw capacitance measurement from channel Y. Units after

		application of scale and offset are nanofarads.



What:		/sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw

KernelVersion:	3.2

Contact:	linux-iio@vger.kernel.org

Description:

		Raw differential capacitance measurement equivalent to

		channel Y - channel Z where these channel numbers apply to the

		physically equivalent inputs when non differential readings are

		separately available. In differential only parts, then all that

		is required is a consistent labeling.  Units after application

		of scale and offset are nanofarads..



What:		/sys/bus/iio/devices/iio:deviceX/in_temp_raw

What:		/sys/bus/iio/devices/iio:deviceX/in_tempX_raw

What:		/sys/bus/iio/devices/iio:deviceX/in_temp_x_raw
@@ -251,6 +269,7 @@ What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale_available 
What:		/sys/.../iio:deviceX/in_voltageX_scale_available

What:		/sys/.../iio:deviceX/in_voltage-voltage_scale_available

What:		/sys/.../iio:deviceX/out_voltageX_scale_available

What:		/sys/.../iio:deviceX/in_capacitance_scale_available

KernelVersion:	2.635

Contact:	linux-iio@vger.kernel.org

Description: