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Commit ba29becd authored Jul 08, 2015 by Xi Wang Committed by David S. Miller Jul 08, 2015

test_bpf: extend tests for 32-bit endianness conversion



Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if
the upper bits of the result are zeros (the arm64 JIT had such bugs).
Extend the two tests to catch this.

Acked-by: Daniel Borkmann <daniel@iogearbox.net>
Acked-by: Alexei Starovoitov <ast@plumgrid.com>
Signed-off-by: Xi Wang <xi.wang@gmail.com>
Signed-off-by: David S. Miller <davem@davemloft.net>

parent ca661a28

lib/test_bpf.c

+6 −0

Original line number	Diff line number	Diff line
		@@ -3674,6 +3674,9 @@ static struct bpf_test tests[] = {
		.u.insns_int = {
		BPF_LD_IMM64(R0, 0x0123456789abcdefLL),
		BPF_ENDIAN(BPF_FROM_BE, R0, 32),
		BPF_ALU64_REG(BPF_MOV, R1, R0),
		BPF_ALU64_IMM(BPF_RSH, R1, 32),
		BPF_ALU32_REG(BPF_ADD, R0, R1), /* R1 = 0 */
		BPF_EXIT_INSN(),
		},
		INTERNAL,
		@@ -3708,6 +3711,9 @@ static struct bpf_test tests[] = {
		.u.insns_int = {
		BPF_LD_IMM64(R0, 0x0123456789abcdefLL),
		BPF_ENDIAN(BPF_FROM_LE, R0, 32),
		BPF_ALU64_REG(BPF_MOV, R1, R0),
		BPF_ALU64_IMM(BPF_RSH, R1, 32),
		BPF_ALU32_REG(BPF_ADD, R0, R1), /* R1 = 0 */
		BPF_EXIT_INSN(),
		},
		INTERNAL,