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Commit 28e679ae authored by Johan Hovold's avatar Johan Hovold Committed by Greg Kroah-Hartman
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USB: digi_acceleport: remove bogus disconnect test in close



Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: default avatarJohan Hovold <jhovold@gmail.com>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@linuxfoundation.org>
parent 1bc77f4d
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+45 −47
Original line number Diff line number Diff line
@@ -1149,7 +1149,6 @@ static void digi_close(struct usb_serial_port *port)
	if (port->serial->disconnected)
		goto exit;

	if (port->serial->dev) {
	/* FIXME: Transmit idle belongs in the wait_unti_sent path */
	digi_transmit_idle(port, DIGI_CLOSE_TIMEOUT);

@@ -1185,8 +1184,8 @@ static void digi_close(struct usb_serial_port *port)

	ret = digi_write_oob_command(port, buf, 20, 0);
	if (ret != 0)
			dev_dbg(&port->dev, "digi_close: write oob failed, ret=%d\n", ret);

		dev_dbg(&port->dev, "digi_close: write oob failed, ret=%d\n",
									ret);
	/* wait for final commands on oob port to complete */
	prepare_to_wait(&priv->dp_flush_wait, &wait,
			TASK_INTERRUPTIBLE);
@@ -1195,7 +1194,6 @@ static void digi_close(struct usb_serial_port *port)

	/* shutdown any outstanding bulk writes */
	usb_kill_urb(port->write_urb);
	}
exit:
	spin_lock_irq(&priv->dp_port_lock);
	priv->dp_write_urb_in_use = 0;